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Local Electrical Stress-Induced Doping and Formation of 2D Monolayer Graphene P-N Junction

机译:局部电应力诱导掺杂和二维单层膜的形成   石墨烯p-N结

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摘要

We demonstrated doping in 2D monolayer graphene via local electricalstressing. The doping, confirmed by the resistance-voltage transfercharacteristics of the graphene system, is observed to continuously tunablefrom N-type to P-type as the electrical stressing level (voltage) increases.Two major physical mechanisms are proposed to interpret the observed phenomena:modifications of surface chemistry for N-type doping (at low-level stressing)and thermally-activated charge transfer from graphene to SiO2 substrate forP-type doping (at high-level stressing). The formation of P-N junction on 2Dgraphene monolayer is demonstrated with complementary doping based on locallyapplied electrical stressing.
机译:我们通过局部电应力在2D单层石墨烯中进行了掺杂。观察到掺杂随石墨烯系统的电阻-电压传递特性而确定,随着电应力水平(电压)的增加,掺杂可以从N型连续调谐到P型。提出了两种主要的物理机理来解释观察到的现象:修饰N型掺杂(在低水平应力下)的表面化学性质以及热活化电荷从石墨烯到SiO2衬底的热活化电荷转移(P型掺杂)(在高水平应力下)。通过基于局部施加的电应力的互补掺杂,证明了2D石墨烯单层上P-N结的形成。

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